JPH0355097Y2 - - Google Patents

Info

Publication number
JPH0355097Y2
JPH0355097Y2 JP1984044446U JP4444684U JPH0355097Y2 JP H0355097 Y2 JPH0355097 Y2 JP H0355097Y2 JP 1984044446 U JP1984044446 U JP 1984044446U JP 4444684 U JP4444684 U JP 4444684U JP H0355097 Y2 JPH0355097 Y2 JP H0355097Y2
Authority
JP
Japan
Prior art keywords
gun
sample
sample holder
ray
ion gun
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1984044446U
Other languages
English (en)
Japanese (ja)
Other versions
JPS60156446U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4444684U priority Critical patent/JPS60156446U/ja
Publication of JPS60156446U publication Critical patent/JPS60156446U/ja
Application granted granted Critical
Publication of JPH0355097Y2 publication Critical patent/JPH0355097Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
JP4444684U 1984-03-27 1984-03-27 Ｘ線光電子分光装置 Granted JPS60156446U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4444684U JPS60156446U (ja) 1984-03-27 1984-03-27 Ｘ線光電子分光装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4444684U JPS60156446U (ja) 1984-03-27 1984-03-27 Ｘ線光電子分光装置

Publications (2)

Publication Number Publication Date
JPS60156446U JPS60156446U (ja) 1985-10-18
JPH0355097Y2 true JPH0355097Y2 (en]) 1991-12-06

Family

ID=30557024

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4444684U Granted JPS60156446U (ja) 1984-03-27 1984-03-27 Ｘ線光電子分光装置

Country Status (1)

Country Link
JP (1) JPS60156446U (en])

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5213479B2 (ja) * 2008-02-28 2013-06-19 矢崎総業株式会社 シール検査方法、及びシール検査装置
JP5430908B2 (ja) * 2008-11-07 2014-03-05 日本電子株式会社 分光分析装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56138242A (en) * 1980-03-31 1981-10-28 Shimadzu Corp X-ray photoelectron analysis equipment

Also Published As

Publication number Publication date
JPS60156446U (ja) 1985-10-18

Similar Documents

Publication Publication Date Title
JP3166638B2 (ja) 蛍光ｘ線分析装置
US3919548A (en) X-Ray energy spectrometer system
TWI646327B (zh) 螢光ｘ射線分析裝置
JPH0355097Y2 (en])
CN114207421B (zh) 荧光x射线分析装置及荧光x射线分析装置的控制方法
KR930014870A (ko) 집속이온빔을 이용한 집적회로의 동작분석방법 및 그 장치
JPS6341185B2 (en])
JP3108837B2 (ja) 異物状態分析方法
JP2767582B2 (ja) 蛍光ｘ線分析方法
JPH0314775Y2 (en])
EP3559977B1 (en) Handheld material analyser
JP3121554B2 (ja) 照射室開放型ｘ線分析装置
JP4095551B2 (ja) 光源の光度を自動制御する機能を有する果物特性測定装置
JP2584946Y2 (ja) 蛍光ｘ線分析装置
JP3139107B2 (ja) 蛍光ｘ線分析装置
JPS609760Y2 (ja) 可動中性子束検出系の検出器駆動装置
JPS63281341A (ja) エネルギ−分散型ｘ線分光器を備えたｘ線分析装置
KR20180131712A (ko) 온라인 용액 성분 측정장치.
JPH07294411A (ja) 粒度分布測定装置
JPH0515718Y2 (en])
JPH10206357A (ja) Ｘ線分析装置
JP3502915B2 (ja) グロー放電発光分光分析装置
JPH01118757A (ja) 表面分析装置のマスク
JP2544987B2 (ja) 半導体素子研磨装置
KR0139961Y1 (ko) 엑스선 광전자 분광장치